nanoandmore/HQ:XSC11/Al BS/HQ:XSC11/Al BS-200/Box of 200 AFM Probes

Applications:

Force Modulation (FM) AFM ProbesContact Mode AFM ProbesNon-Contact / Standard Tapping Mode AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes

Description:

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications. Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

shape: Rotated

height: 15 µm (12 - 18 µm)*

radius:

full cone angle: 40°

AFM Cantilevers:

Cantilever A

shape: Beam

length: 500 µm

width: 30 µm

thickness: 2.7 µm

force constant: 0.2 N/m (0.1 - 0.4 N/m)*

resonance frequency: 15 kHz (12 - 18 kHz)*

Cantilever B

shape: Beam

length: 210 µm

width: 30 µm

thickness: 2.7 µm

force constant: 2.7 N/m (1.1 - 5.6 N/m)*

resonance frequency: 80 kHz (60 - 100 kHz)*

Cantilever C

shape: Beam

length: 150 µm

width: 30 µm

thickness: 2.7 µm

force constant: 7 N/m (3 - 16 N/m)*

resonance frequency: 155 kHz (115 - 200 kHz)*

Cantilever D

shape: Beam

length: 100 µm

width: 50 µm

thickness: 2.7 µm

force constant: 42 N/m (17 - 90 N/m)*

resonance frequency: 350 kHz (250 - 465 kHz)*

* typical range