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nanoandmore/PtSi-FM/PtSi-FM-10/Box of 10 AFM Probes

Cantilever:

F:75kHz
C:2.8N/m
L:225µm

Applications:

ConductiveAFMProbes
PlatinumSilicideAFMProbes

Description:

TheFMtypeisofferedforforcemodulationmicroscopy.TheforceconstantofthisAFMprobespansthegapbetweencontactandnon-contactmodeandisspeciallytailoredfortheforcemodulationmode.ThisprobetypecombineshighoperationstABIlitywithoutstandingsensitivityandfastscanningability.

Forapplicationsthatrequireawearresistantandanelectricallyconductivetipwerecommendthistype.NANOSENSORSPtSi-FMprobesaresuitableforC-AFM,TunnelingAFM,ScanningCapacitanceMicroscopy(SCM),ElectrostaticForceMicroscopy(EFM)andKelvinProbeForceMicroscopy(KFPM).

ThePlatinumSilicidecoatingshowsanexcellentconductivity(almostapproachingmetalconductivity).ThetypicaltiprADIusofcurvatureisaround25nm.

Theprobeoffersuniquefeatures:
  • platinumsilicidecoatingwithexcellentconductivityandgoodwear-outbehavior
  • chemicallyinert
  • highmechanicalQ-factorforhighsensitivity
  • alignmentgroovesonbacksideofsiliconholderchip
  • precisealignmentofthecantileverposition(within+/-2µm)whenusedwiththeAlignmentChip
  • compatIBLewithPointProbe®PlusXY-AlignmentSeries
Platinumsilicideonbothsidesofthecantilever.

AFMTip:

  • AFMCantilever:

  • 225µm(215-235µm)*
  • 28µm(20-35µm)*
  • 3µm(2-4µm)*
  • 2.8N/m(0.5-9.5N/m)*
  • 75kHz(45-115kHz)*
  • *guaranteedrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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