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nanoandmore/HQ:CSC17/No Al/HQ:CSC17/No Al-100/Box of 100 AFM Probes

Cantilever:

F:13kHz
C:0.18N/m
L:450µm

Applications:

ContactModeAFMProbes

Description:

Cantileversofthe17serieswiththelowspringconstantareusedincontactmodeAFMmostly.ItispossIBLetoadjustthescanningparameterstominimizethetip-sampleforce.Imagingintappingmodegivesthetruetopographyofthesoftsamples.Uncoated

AFMTip:

  • AFMCantilever:

  • Beam
  • 450µm
  • 50µm
  • 2µm
  • 0.18N/m(0.06-0.4N/m)*
  • 13kHz(10-17kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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