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nanoandmore/CONTSCR/CONTSCR-20/Box of 20 AFM Probes

Cantilever:

F:25kHz
C:0.2N/m
L:225µm

Applications:

ContactModeAFMProbes

Description:

NanoWorldPointprobe®CONTSCRAFMprobeisanalternativecantilevertypeforcontactmodeapplications.Thelengthofcantileverisreducedwithrespecttothepreferredcontactmodetypeenablingeasierexchangewithnon-contactmodeprobesforsomeAFMinstruments.Additionally,thisprobetypeallowstheapplicationforlateralorfrictionforcemode.

AllSPMprobesofthePointprobe®seriesaremadefrommonolithicsiliconwhichishighlydopedtodissipatestaticcharge.TheyarechemicallyinertandofferahighmechanicalQ-factorforhighsensitivity.Thetipisshapedlikeapolygonbasedpyramid.

Additionally,thisprobeoffersanexcellenttiprADIusofcurvature.

AluminumReflexCoating

Thealuminumreflexcoatingconsistsofa30nmthickaluminumlayerdepositedonthedetectorsideofthecantileverwhichenhancesthereflectanceofthelaserbeambyafactorof2.5.FurThermoreitpreventslightfrominterferingwithinthecantilever.

Asthecoatingisalmoststress-freethebendingofthecantileverduetostressislessthan2degrees.

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(220-230µm)*
  • 48µm(42.5-52.5µm)*
  • 1µm(0.5-1.5µm)*
  • 0.2N/m(0.02-0.7N/m)*
  • 25kHz(10-39kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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