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nanoandmore/Multi75DLC/Multi75DLC-50/Box of 50 AFM Probes

Cantilever:

F:75kHz
C:3N/m
L:225µm

Applications:

Hardened/EnhancedWearResistanceAFMProbes
NanoindentationandLithographyAFMProbes
Hardened/EnhancedWearResistanceTappingAFMProbes

Description:

MonolithicsiliconAFMprobeforforcemodulationandpulsedforcemode(PFM).

HighdurABIlityandhydrophobicity duetoDiamond-Like-Carboncoatingontipsideofthecantilever.

Therotatedtipallowsformoresymmetricrepresentationofhighsamplefeatures.TheconsistenttiprADIusensuresgoodresolutionandreproducibility.

TheAFMholderchipfitsmostcommercialAFMsystemsasitisindustrystandardsize.ItiscompatIBLewith:

  • Bruker/Veeco/DigitalInstruments
  • Keysight/Agilent/MolecularImaging
  • AsylumResearch
  • ParkSystems
  • JEOL
  • JPK
  • etc.

FormeasurementsinliquidspleaseusethebacksidegoldcoatedMulti75GD-GortheoverallgoldcoatedMulti75GB-G!

Consistenthighqualityatalowerprice!

Diamond-Like-Carboncoatingontipsideofthecantilever,15nmthick;Aluminumcoatingondetectorsideofthecantilever,30nmthick

AFMTip:

  • AFMCantilever:

  • Beam
  • 225µm(215-235µm)*
  • 28µm(23-33µm)*
  • 3µm(2-4µm)*
  • 3N/m(1-7N/m)*
  • 75kHz(60-90kHz)*
  • *typicalrangeThisproductfeaturesalignmentgroovesonthebacksideoftheholderchip.
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